5962F1222801V9AX中文資料瑞薩數(shù)據(jù)手冊PDF規(guī)格書

Features

? Electrically screened to DLA SMD# 5962-12228

? Low input offset voltage. . . . . . . . . . . . . . ±110μV, maximum

? Superb offset temperature coefficient. . .1μV/°C, maximum

? Input bias current . . . . . . . . . . . . . . . . . . . . . .±5nA, maximum

? Input bias current TC . . . . . . . . . . . . . . . ±5pA/°C, maximum

? Low current consumption . . . . . . . . . . . . . . . . . . . . . . . 440μA

? Voltage noise . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8nV/√Hz

? Wide supply range . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 40V

? Operating temperature range. . . . . . . . . . . .-55°C to +125°C

? Radiation environment

- SEB LETTH (VS = ±20V) . . . . . . . . . . . . . . 73.9MeV?cm2/mg

- Total dose, high dose rate. . . . . . . . . . . . . . . . . 300krad(Si)

- Total dose, low dose rate . . . . . . . . . . . . . . . . 100krad(Si)*

- SEL immune (SOI process)

* Product capability established by initial characterization. The

EH version is acceptance tested on a wafer-by-wafer basis to

50krad(Si) at low dose rate.

Related Literature

For a full list of related documents, visit our website

? ISL70417SEH product page