7030661中文資料圖爾克數(shù)據(jù)手冊(cè)PDF規(guī)格書(shū)

Features

■The high-temperature tags must undergo

adequate stress tests within the proposed

temperature processes before deployment.

■The following stress test was performed on

this tag:

Cyclic temperature stress: 20 min. at 20 °C

– 20 min. at 220 °C.

Number of tested cycles: 1500

This successfully performed test does

not imply suitability for a specific hightemperature application, but merely serves

as proof of the basic usability.

■The TH-Q51S-HT and TH-Q51T-HT

brackets protect the tag from mechanical

loads and allow the mounting on metal.

■EEPROM, memory 128 byte

■Not for direct mounting on metal

Functional principle

The HF read/write devices operating at a

frequency of 13.56 MHz form a transmission

zone the size of which (0…500 mm) varies,

depending on the combination of read/write

head and tag used.

The read/write distances mentioned here only

represent standard values measured under

laboratory conditions, free from any influences

caused by surrounding materials.

The read/write distances of tags suitable for

mounting in/on metal were determined in/on

metal.

Attainable distances may vary by up to 30

% due to component tolerances, mounting

conditions, ambient conditions and material

qualities (especially when mounted in metal).

Testing of the application under real operating

conditions is therefore essential, especially

with on-the-fly reading and writing!