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AM29F100B-120DTI中文資料超威半導(dǎo)體數(shù)據(jù)手冊(cè)PDF規(guī)格書

AM29F100B-120DTI
廠商型號(hào)

AM29F100B-120DTI

功能描述

1 Megabit (128 K x 8-Bit/64 K x 16-Bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory-Die Revision 1

文件大小

57.24 Kbytes

頁(yè)面數(shù)量

8 頁(yè)

生產(chǎn)廠商 Advanced Micro Devices
企業(yè)簡(jiǎn)稱

AMD超威半導(dǎo)體

中文名稱

美國(guó)超威半導(dǎo)體公司官網(wǎng)

原廠標(biāo)識(shí)
數(shù)據(jù)手冊(cè)

下載地址一下載地址二到原廠下載

更新時(shí)間

2024-11-17 20:00:00

AM29F100B-120DTI規(guī)格書詳情

GENERAL DESCRIPTION

The Am29F100 in Known Good Die (KGD) form is a 1 Mbit, 5.0 Volt-only Flash memory. AMD defines KGD as standard product in die form, tested for functionality and speed. AMD KGD products have the same reliability and quality as AMD products in packaged form.

DISTINCTIVE CHARACTERISTICS

■ Single power supply operation

— 5.0 V ± 10 for read, erase, and program operations

— Simplifies system-level power requirements

■ High performance

— 120 ns maximum access time

■ Low power consumption

— 20 mA typical active read current for byte mode

— 28 mA typical active read current for word mode

— 30 mA typical program/erase current

— 25 μA typical standby current

■ Flexible sector architecture

— One 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and

one 64 Kbyte sectors (byte mode)

— One 8 Kword, two 4 Kword, one 16 Kword, and

one 32 Kword sectors (word mode)

— Any combination of sectors can be erased

— Supports full chip erase

■ Top or bottom boot block configurations available

■ Sector protection

— Hardware-based feature that disables/reenables

program and erase operations in any combination of sectors

— Sector protection/unprotection can be

implemented using standard PROM

programming equipment

— Temporary Sector Unprotect feature allows in

system code changes in protected sectors

■ Embedded Algorithms

— Embedded Erase algorithm automatically

pre-programs and erases the chip or any

combination of designated sector

— Embedded Program algorithm automatically

programs and verifies data at specified address

■ Minimum 100,000 program/erase cycles guaranteed

■ Compatible with JEDEC standards

— Pinout and software compatible with

single-power-supply flash

— Superior inadvertent write protection

■ Data Polling and Toggle Bits

— Provides a software method of detecting

program or erase cycle completion

■ Ready/Busy pin (RY/BY#)

— Provides a hardware method for detecting

program or erase cycle completion

■ Erase Suspend/Erase Resume

— Suspends an erase operation to read data from,

or program data to, a sector that is not being

erased, then resumes the erase operation

■ Hardware RESET# pin

— Hardware method of resetting the device to

reading array data

■ Tested to datasheet specifications at temperature

■ Quality and reliability levels equivalent to

standard packaged components

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