DAC1617D1G0集成電路（IC）的數(shù)模轉(zhuǎn)換器（DAC）規(guī)格書PDF中文資料

General description

The DAC1617D1G0 is a high-speed 16-bit dual channel Digital-to-Analog Converter (DAC) with selectable x2, x4 and x8 interpolation filters. The device is optimized for multi-carrier and broadband wireless transmitters at sample rates of up to 1 Gsps. Supplied from a 3.3 V and a 1.8 V source, the DAC1617D1G0 integrates a differential scalable output current up to 34 mA.

Features and benefits

■ Dual-channel 16-bit resolution

■ Synchronization of multiple DAC devices

■ 1 Gsps maximum update rate

■ 3-wire or 4-wire mode SPI interface

■ Selectable x2, x4 and x8 interpolation filters

■ Differential scalable output current from 8.1 mA to 34 mA

■ Very low noise capacitor-free integrated Phase-Locked Loop (PLL)

■ External analog offset control (10-bit auxiliary DACs)

■ Embedded Numerically Controlled Oscillator (NCO) with 40-bit programmable frequency

■ High resolution internal digital gain and offset control to support high performance IQ-modulator image rejection

■ Embedded complex(I/Q) digital IF modulator

■ Internal phase correction

■ 1.8 V and 3.3 V power supplies

■ Inverse (sin x) / x function

■ LVDS DDR compatible input interface with on-chip 100 Ω terminations

■ Power-down mode and Sleep mode; 5-bit NCO low-power mode

■ LVDS DDR input clock up to 370 MHz

■ On-chip 1.25 V reference

■ LVDS or LVPECL compatible DAC clock

■ Industrial temperature range -40 °C to +85 °C

■ Interleaved or folded I and Q data input mode

■ 72 pins small form factor HVQFN package

Applications

■ Wireless infrastructure: LTE, WiMAX, GSM, CDMA, WCDMA, TD-SCDMA

■ Communications: LMDS/MMDS, point-to-point

■ Direct Digital Synthesis (DDS)

■ Broadband wireless systems

■ Digital radio links

■ Instrumentation

■ Automated Test Equipment (ATE)