Description

E42X7 is a family of Dual Channel Parametric Measurement Units (PMU) designed for automated test equipment and instrumentation. Manufactured in a wide voltage Bi-CMOS process, it is a monolithic solution for a

per-pin PMU.

The E42X7 family consists of three products:

E4287

? 16.25V I/O range

? 4 current ranges up to ± 40 mA

? Analog mux for providing a FLASHTM programming level

? Driven guard pin

E4257

? 16.25V I/O range

? 4 Current ranges up to ± 40 mA

? Small 9mm x 9mm footprint

E4237

? 16.25VI/O range

? 2 current ranges up to ± 4 mA

? Low capacitance for use in relayless tester architectures

Features

? Four Quadrant Operation (FV/MI, FV/MV, FI/MV, FI/MI)

? 4 Current Ranges (± 40 μA, ± 400 μA, ± 4 mA, ± 40 mA) (E4287, E4257)

? 2 Current Ranges (± 40 μA and ± 4 mA) (E4237)

? Wide Output Voltage Range

– –3.25V to +13V @ RF pin across all ranges

– –3.25V to ± 13V @ FORCE Pin (Ranges A, B, C)

– –1.25V to +11V @ FORCE (Range D)

? Low Power Dissipation

? FV Linearity to ± 0.025 FSVR

? Extremely Fast Settling Times offer reduced test times/increased tester thru-put.

? Central PMU Switches for External PMU,

–4.75 V to +14.5V, ± 40 mA Ranges

? Switches for Pin Driver Super Voltages

? Driven Guard Output (E4287)

? Test Head Ground Reference

? Stable with up to 300 pF Capacitive Loading with no external compensation capacitors

? Switchable Compensation allows stability with up to 10 nF Capacitive Loading

? 14x14 mm, 80 Pin MQFP Package (E4287)

? Small, 9x9 mm, 64-Pad LPCC Package (E4237, E4257)

Applications

? Automated Test Equipment

– Memory Testers

– Logic Testers

– Mixed Signal Testers

– SOC Testers

? Instrumentation