EVAL-ADUM4137EBZ開發(fā)板套件編程器的評估演示板及套件規(guī)格書PDF中文資料

EVAL-ADUM4137EBZ屬于開發(fā)板套件編程器的評估演示板及套件。由亞德諾半導(dǎo)體技術(shù)有限公司制造生產(chǎn)的EVAL-ADUM4137EBZ評估和演示板及套件該系列產(chǎn)品提供了一種方便的方法，在經(jīng)過驗證的實施環(huán)境中評估某些重點器件的性能或特性。評估方法通常有完善的文檔說明，并且視乎具體情況由評估軟件提供支持。產(chǎn)品通常由印刷電路板組成，板上已裝有重點器件以及必要或有用的支持元器件，另外也可能包括其他組件，例如電纜或電源。對于數(shù)量特別多或類別獨特的器件類別(如 ADC、DAC 和開關(guān)模式電源)，評估平臺可組合為一個單獨的產(chǎn)品系列。

GENERAL DESCRIPTION

The ADuM41371 is a single-channel gate driver specifically optimized for driving insulated gate bipolar transistors (IGBTs). Analog Devices, Inc., iCoupler? technology provides isolation between the input signal and the output gate drive.

The Analog Devices chip scale transformers also provide isolated communication of control information between the high voltage and low voltage domains of the chip. Information on the status of the chip can be read back from the dedicated fault outputs. The ADuM4137 provides isolated fault reporting for overcurrent events, remote temperature overheating events, undervoltage lockout (UVLO), and thermal shutdown (TSD). Integrated onto the ADuM4137 is an overcurrent detection feature that protects the IGBT in case of overcurrent events. The split emitter overcurrent detection is coupled with a high speed, two-level turn off in case of faults.

The ADuM4137 provides a Miller clamp control signal for the external metal-oxide semiconductor field effect transistor (MOSFET) to provide robust IGBT turn off with a single rail supply when the gate voltage drops below 2.0 V (typical) and above GND2. Operation with unipolar secondary supplies is possible, with or without the Miller clamp operation.

A low gate voltage detection circuit can trigger a fault if the gate voltage does not go above the internal threshold (VVL) within the time allowed from turn on (tDVL). This circuit allows detection of IGBT device failures that exhibit gate shorts or other causes of weak drive.

The secondary falling UVLO is set to 11.24 V (typical) for common IGBT two-level plateau voltage levels.

The ADuM4137 provides for in field programming of temperature. Two temperature sensor pins allow isolated monitoring of system temperatures at the IGBTs, sensing diode gains and offsets by means of a serial port interface (SPI) bus on the primary side of the device. Values are stored on an EEPROM located on the secondary side. Additionally, programming is available for specific voltage offsets, temperature sensing reporting frequencies, and important delays.

The ASC pin on the secondary side on the ADuM4137 allows the driver to be switched on from the secondary side if no faults are present.

FEATURES

6 A peak drive output capability

Internal turn off NFET, on resistance: <0.95 Ω

Internal turn on PFET, on resistance: <1.18 Ω

Split emitter overcurrent detection

Miller clamp output with gate sense input

Isolated fault output

Isolated temperature sensor read back

Propagation delay

Rising: 105 ns typical

Falling: 107 ns typical

Minimum pulse width: 70 ns

Operating junction temperature range (?40°C to +150°C)

VDD1 and VDD2 UVLO

ASC input

8.3 mm creepage distance

Safety and regulatory approvals

5 kV rms for 1 minute per UL 1577

CSA Component Acceptance Notice 5A

DIN V VDE V 0884-10 (VDE V 0884-10):2006-12

VIORM = 849 VPEAK (reinforced/basic)

AEC-Q100 qualified for automotive applications