ISL55100B開發(fā)板套件編程器的評估演示板及套件規(guī)格書PDF中文資料

The ISL55100B is a Quad pin driver and window comparator

fabricated in a wide voltage CMOS process. It is designed

specifically for Test During Burn-In (TDBI) applications, where

cost, functional density and power are all at a premium.

This IC incorporates four channels of programmable drivers

and window comparators into a small 72 Ld QFN package.

Each channel has independent driver levels, data and high

impedance control. Each receiver has dual comparators, which

provide high and low threshold levels.

The ISL55100B uses differential mode digital inputs and can

therefore mate directly with LVDS or CML outputs.

Single-ended logic families are handled by connecting one of

the digital input pins to an appropriate threshold voltage (e.g.,

1.4V for TTL compatibility). The comparator outputs are

single-ended and the output levels are user defined to mate

directly with any digital technology.

The 18V driver output and receiver input ranges allow this

device to interface directly with TTL, ECL, CMOS (3V, 5V and

7V), LVCMOS and custom level circuitry, as well as the high

voltage (super voltage) level required for many special test

modes for Flash Devices.

Features

? Low driver output resistance

- ROUT typical: 9.0Ω

? 18V I/O range

? 50MHz operation

? 4 Channel driver/receiver pairs with per pin flexibility

? Dual level - per pin - input thresholds

? Differential or single-ended digital inputs

? User defined comparator output levels

? Low channel-to-channel timing skew

? Small footprint (72 Ld QFN)

? Pb-free (RoHS compliant)

Applications

? Burn in ATE

? Wafer level flash memory test

? LCD panel test

? Low cost ATE

? Instrumentation

? Emulation

? Device programmers