ISL72813SEHEV1Z中文資料瑞薩數(shù)據(jù)手冊(cè)PDF規(guī)格書

Features

? Electrically screened to SMD 5962-17208

? Acceptance tested to 100krad(Si) (HDR) and to 50krad(Si)

(LDR) wafer-by-wafer

? Integrated 5-bit to 32-channel decoder

? Integrated level shifting circuit

? High collector current outputs

? High voltage outputs

? Grounded metal lid

? Full military temperature range operation

- TA = -55°C to +125°C

- TJ = -55°C to +150°C

? Radiation tolerance

- HDR (50rad(Si)/s to 300rad(Si)/s) . . . . . . . . . 100krad(Si)

- LDR (0.01rad(Si)/s) . . . . . . . . . . . . . . . . . . . . . . . 50krad(Si)

? SEE hardness

- No SEB/SEL LETTH, VCE = 33V . . . . . . . 86.4MeV?cm2/mg