- IC/元器件
- PDF資料
- 商情資訊
MG113P中文資料沖電線數(shù)據(jù)手冊(cè)PDF規(guī)格書
MG113P規(guī)格書詳情
DESCRIPTION
Oki’s 0.25μm Application-Specific Integrated Circuit (ASIC) products are available in both Sea Of Gates (SOG) and Customer Structured Array (CSA) architectures. Both the SOG-based MG115P series and the CSA-based MG75P series use a five-layer metal process on 0.25μm drawn (0.18μm L-effective) CMOS technology. The SOG MG113P/114P series uses the same SOG base-array architecture as the MG115P series, but offers four and three metal layers, respectively. The MG73P/74P CSA series uses three and four metal layers, respectively. The semiconductor process is adapted from Oki’s production-proven 64-Mbit DRAM manufacturing process.
FEATURES
? 0.25μm drawn 3-, 4-, and 5-layer metal CMOS
? Optimized 2.5-V core
? Optimized 3-V I/O
? SOG and CSA architecture availability
? 77-ps typical gate propagation delay (for a 4x drive inverter gate with a fanout of 2 and 0 mm of wire, operating at 2.5 V)
? Over 5.4M raw gates and 868 I/O pads using 60μ staggered I/O
? User-configurable I/O with VSS, VDD, TTL, 3-state, and 1- to 24-mA options
? Slew-rate-controlled outputs for low-radiated noise
? H-clock tree cells which reduces the maximum skew for clock signals
? Low 0.2μW/MHz/gate power dissipation
? User-configurable single- and dual-port memories
? Specialized IP cores and macrocells including 32-bit ARM7TDMI CPU, phase-locked loop (PLL), and peripheral component interconnect (PCI) cells
? Floorplanning for front-end simulation, back end layout controls, and link to synthesis
? Joint Test Action Group (JTAG) boundary scan and scan path Automatic Test Pattern Generation (ATPG)
? Support for popular CAE systems including Cadence, IKOS, Mentor Graphics, Model Technology, Inc. (MTI), Synopsys, and Viewlogic
產(chǎn)品屬性
- 型號(hào):
MG113P
- 制造商:
OKI
- 制造商全稱:
OKI electronic componets
- 功能描述:
0.25レm Sea of Gates and Customer Structured Arrays