XOPA2205DGKR中文資料德州儀器數(shù)據(jù)手冊PDF規(guī)格書

1 Features

? e-trim? operational amplifier performance

– Low offset voltage: 15 μV (max)

– Low offset voltage drift: ±0.2 μV/°C (max)

? Super beta inputs

– Input bias current: 0.4 nA (max)

– Input current noise: 110 fA/√Hz

? Low noise

– 0.1 to 10-Hz: 0.2 μVPP

– Voltage noise: 7.2 nV/√Hz

? AOL, CMRR, and PSRR: > 126 dB (full

temperature range)

? Gain bandwidth product: 3.6 MHz

? Low quiescent current: 240 μA (max)

? Slew rate: 4 V/μs

? Overload power limiter

? Rail-to-rail output

? EMI and RFI filtered inputs

? Wide supply: 4.5 V to 36 V

? Temperature range: –40°C to +125°C

? Available in high grade (OPAx205) and standard

grade (OPAx205A)

2 Applications

? Flow transmitter

? String inverter

? Data acquisition (DAQ)

? Source measurement unit (SMU)

? Lab and field instrumentation

? Battery test

? Analog input module

? Pressure transmitter

3 Description

The OPA205 and OPA2205 (OPAx205) are the

next generation of the industry-standard OPAx277

family. These devices are precision, bipolar e-trim?

operational amplifiers with super-beta inputs. The

devices use TI's proprietary trimming technology to

achieve an input offset voltage of ±2 μV (typical) and

an input offset voltage drift of ±0.04 μV (typical).

Designed on a bipolar process, the OPAx205 provide

3.6?MHz gain bandwidth for a mere 220 μA of

quiescent current. The devices also achieve a low

voltage noise density of only 7.2 nV/√Hz at 1 kHz.

Thanks to super-beta inputs, the OPAx205 have a

very low input bias current of 100 pA (typ) and a

current noise density of 110 fA/√Hz.

The high performance of the OPAx205 makes

these devices an excellent choice for systems

requiring high precision and low power consumption,

such as flow and pressure transmitters, portable

data acquisition (DAQ) systems, and high-density

source measurement units (SMU). The OPA206 and

OPA2206 are related devices with the same op

amp core, but with the additional feature of input

overvoltage protection.